## The thickness of an epitaxial layer on a silicon wafer is specified to be 14.5 ± 0.5 micro meters.

The thickness of an epitaxial layer on a silicon wafer is specified to be 14.5 ± 0.5 micro meters. Assume the manufacturing process is in statistical control where the distribution of the thickness is normal with mean µ = 14.5 and standard deviation σ = 0.4. To monitor the production process the mean thickness of four wafers is determined at regularly spaced time intervals. (a) Compute the lower and upper control limits LCLX, UCLX for a three-sigma control chart for the process mean. (b) Compute the lower and upper control limits LCLR, UCLR for a three-sigma control chart for the process variation. (c) Determine the probability that a sample mean (based on a sample of size n = 4) falls outside the tolerance limits 14.5 ± 0.5.

### Identify the DSM-5 diagnostic criteria that you notice in the case studies below and explain how the client meets the criteria.

Part 1: Case Studies Directions: Identify the DSM-5 diagnostic criteria that you notice in the case studies below and explain how the client meets the criteria. Include the diagnosis that….

### Customer Turnoffs Discussion

DECISION MAKING AT WORK Project 3.4 Customer Turnoffs Discussion You are sitting in the company lunchroom with two other CSRs, Doug and Christine. Doug is relating a troublesome customer problem….

### Drawing upon relevant theories from lectures and readings, write a four to five-page analysis of the change efforts made at NUMMI and General Motors

Listen (or read the transcript) to This American Life, episode 561: NUMMI 2015, which can be found at the following link: http://www.thisamericanlife.org/radio-archives/episode/561/nummi-2015 Drawing upon relevant theories from lectures and readings, write a four….